Characterization of microstructure by X-ray line profile analysis  Page description

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Details of project

  
Identifier
46990
Type K
Principal investigator Ungár, Tamás
Title in Hungarian Mikroszerkezet karakterizációja röntgen vonalprofil analízis alapján
Title in English Characterization of microstructure by X-ray line profile analysis
Panel Physics 1
Department or equivalent Department of Materials Physics (Eötvös Loránd University)
Participants Groma, István
Lendvai, János
NGUYEN, QUANG CHINH
Ribárik, Gábor
Szenes, György
Starting date 2004-01-01
Closing date 2007-12-31
Funding (in million HUF) 17.234
FTE (full time equivalent) 0.00
state closed project





 

Final report

  
Results in Hungarian
A " Mikroszerkezet karakterizációja röntgen vonalprofil analízis alapján" c. T-046990, OTKA pályázat rövid szakmai összefoglalója, zárójelentés A deformációs anizotrópia jelenségét kihasználva részletes elméleti és kísérletes kutatásokat végeztünk a mikroszerkezet kvalitatív és kvantitatív karakterizációjára vonatkozóan köbös, hexagonális és ortorombos kristályrendszerekben a röntgen vonalprofil analízis módszerével. A földkéregben mintegy 100 km-es mélységben fekvő ortorombos MgSiO3 perovszkitokat szimuláló mintát állítottunk elő magas hőmérsékletű nagynyomású présben. Megállapítottuk, hogy csak <100> és <010> Burgers vektorú diszlokációk jönnek létre. 700 és 1000 K közötti hőmérsékleteken összenyomással deformált Ge egykristályokban helyfüggő mikrodiffrakcióval megállapítottuk, hogy a mikroszerkezet jelentős fluktuációkat mutat. [001], [011] és [111] textúrájú NiAl emlékező ötvözet mintákban meghatároztuk a különböző textúra komponensekhez tartozó kemény illetve puha krisztallit populációkban az aktív Burgers vektor típusokat valamint diszlokációsűrűségeket. Golyósmalomban őrölt alkáli földfém fluoridok krisztallitméret és diszlokációsűrűség meghatározása során felfedeztük, hogy pormintákban is létrejön röntgen optikai interferencia. Módszert dolgoztunk ki Burgers vektor típusok meghatározására hcp kristályokban. Kidolgoztuk a rétegződési hibák és ikerhatárok gyakoriságának meghatározási módszerét köbös kristályokban. A módszert számos esetben sikeresen alkalmaztuk.
Results in English
"Characterization of microstructure by X-ray line profile analysis" Short summary of the T-046990, OTKA project, final report On the basis strain anisotropy detailed theoretical and experimental work has been carried out for the characterization of the microstructure in cubic, hexagonal and orthorhombic crystal structures by using the method of X-ray line profile analysis. A synthetic orthorhombic MgSiO3 perovskite was prepared the high temperature and pressure. We have found that only <100> and <010> type Burgers vectors are present in the deformed crystals. Ge single crystals were deformed by compression between 700 and 1000 K. Position sensitive microdiffraction has revealed that the deformed microstructure is strongly fluctuating on different length scales. NiAl shape memory alloys with [001], [011] and [111] textures were deformed by compression. We have determined the active Burgers vector types and dislocation densities in the different texture components for different grain orientation populations. Alkali-halide fluorides were ball milled to different extent. We have shown that X-ray optical interference can occur in nanocrystalline powder specimens. A method has been worked out to determine active Burgers vector types in hexagonal crystal systems, and the frequency of stacking faults and twin boundaries in cubic crystals. The methods have been applied successfully in several different cases.
Full text http://real.mtak.hu/1653/
Decision
Yes





 

List of publications

  
M. Zehetbauer, E. Schafler, T. Ungár: Vacancies in plastically deformed copper, Z. Metallkunde, 96 (2005), 2005
K. Nyilas, A. Misra, T. Ungár: Micro-strains in cold rolled Cu–Nb nanolayered composites determined by X-ray line profile analysis, Acta Materialia, 54 (2006) 751–755, 2006
T. Ungár: Microstructure Parameters from X-ray Line Profile Analysis, in Advanced X-ray Techniques in Research and IndustryCapital Publishing Company, New Delhi, 2006 and IOS Press, 2005, Amsterdam, The Netherlands, Ed. A.K.Singh, pp. 268-2, 2006
M. Kerber, E. Schafler, P. Hanak, G. Ribàrik, S. Bernstorff, T. Ungàr, M. Zehetbauer: Spatial Fluctuations of the Microstructure during Deformation of Cu Single Crystals, Z. Kristallographie, 23 (2006) 381-386, 2006
K. Nyilas, C. Dupas, T. Kruml, L. Zsoldos, T. Ungár, J.L. Martin: Dislocation structures and mechanical behaviour of Ge, Materials Science and Engineering A 387�389 (2004) 25�28, 2004
L. Balogh, J. Gubicza, R. J. Hellmig, Y. Estrin, and T. Ungár: Thermal stability of the microstructure of severely deformed copper, Z.Kristallographie, 23 (2006) 381-386, 2005
E. Schafler, K. Simon, S. Bernstorff, G. Tichy, T. Ungár, M.J. Zehetbauer: A Second-Order Phase-Transformation of the Dislocation Structure during Plastic Deformation Determined by In-Situ Synchrotron X-Ray Diffraction, Acta Materialia 53 (2005) 315-�322, 2005
K. Máthis, K. Nyilas, A. Axt, I. Dragomir-Cernatescu, T. Ungár1, P. Lukáè: The Evolution of Non-Basal Dislocations as a Function of Deformation Temperature in Pure Magnesium Determined by X-ray Diffraction, Acta Materialia,52 (2004) 2889-�2894, 2004
T. Ungár: Microstructure of Nanocrystalline Materials Studied by Powder Diffraction, Z.Kristallographie, 2005
E. Schafler, K. Nyilas, S. Bernstorff, L. Zeipper, M. Zehetbauer, T. Ungàr: Microstructure of post deformed ECAP-Ti investigated by Multiple X-Ray Line Profile Analysis, Z.Kristallographie, 23 (2006) 129-134, 2005
T. Ungár: Microstructure Parameters from X-ray Diffraction Peak Broadening, Scripta Materialia 51 (2004) 777-781, 2004
J. Gubicza, N.H. Nam, L. Balogh, R.J. Hellmig,: Microstructure of severely deformed metals determined, Journal of Alloys and Compounds 378 (2004) 248–252, 2004
T. Ungár, J. Gubicza, G. Tichy, C. Pantea, T.W. Zerda: Size and shape of crystallites and internal stresses in carbon blacks, Composites: Part A 36 (2005) 431-436, 2005
G.A. Voronin and T.W. Zerda,J. Gubicza,T. Ungár,S.N. Dub: Properties of nanostructured diamond-silicon carbide, J. Mater. Res., Vol. 19, No. 9, Sep 2004, 2004
Á. Révész, L. Nagy, G. Ribárik, Zs. Kovács, T. Ungár and J. Lendvai: Microstructural evolution in mechanically alloyed nanocrystalline, Mater. Sci. Forum, in press, 2005
Tamás Ungár, Erhard Schafler, Péter Hanák, Sigrid Bernstorff, and Michael Zehetbauer: Vacancy production during plastic deformation in copper determined by in-situ X-ray diffraction, Mater. Sci. Eng. A, (2006) submitted, 2006
I. Dragomir-Cernatescu, D.S. Li, G. A. Castello-Branco, H. Garmestani, R. L. Snyder, G. Ribarik and T. Ungàr: Microstructure evolution in hot rolled titanium determined by X-ray diffraction peak profile analysis, Z.Kristallographie, 23 (2006) 99-104, 2006
Ribárik, G., Audebrand, N., Palancher, H., Ungár, T., Louër, D.: Dislocations and crystallite size distributions in ball-milled nanocrystalline fluorides MF2 (M = Ca, Sr, Ba, Cd) determined by X-ray diffraction-line-profile analysis, Journal of Applied Crystallography, (2005) 38, 912-926, 2005
Krisztián Nyilas, Hélène Couvy, Patrick Cordier and Tamás Ungár: The Dislocation-Structure and Crystallite-Size in Forsterite (Olivine) Deformed at 1400 oC by 11 GPa, Z. Kristallographie, 23 (2006) 135-140, 2006
T. Ungár, G. Tichy, J. Gubicza and R. J. Hellmig: Correlation between subgrains and coherently-scattering-domains, J. Powder Diffraction, 20 (2005) 366-375, 2005
J. Gubicza, L. Balogh, R.J. Hellmig, Y. Estrin, T. Ungár: Dislocation structure and crystallite size in severely deformed copper by X-ray peak profile analysis, Materials Science and Engineering A, 400–401 (2005) 334-338, 2005
T. Ungár: Subgrain Size-Distributions, Dislocation Structures, Stacking- and Twin Faults and Vacancy Concentrations in SPD Materials Determined by X-ray Line Profile Analysis, Mater. Sci. Forum, 503-504 (2005) 133-140, 2005
T. Ungár, E. Schafler, P. Hanák, S. Bernstorff, M. Zehetbauer: Vacancy concentrations determined from the diffuse background scattering of X-rays in plastically deformed copper, Z. Metallkunde, (2005) 96, 578-583, 2005
Győző Horváth, Péter Kenesei, Sigrid Bernstorff, Tamás Ungár, János Lendvai: Early stages of nucleation and growth of Guinier-Preston zones in Al-Zn-Mg alloys, Z. Metallkunde, 97 (2006) 315-321, 2006
J. Gubicza, T. Ungár, Y. Wang, G. Voronin, C. Pantea, and T. W. Zerda: Microstructure of diamond-SiC nanocomposites determined by X-ray line profile analysis, Diamond and Related Materials, 15 (2006) 1452 – 1456, 2006
L. Balogh, G. Ribárik and T. Ungár: Stacking Faults and Twin Boundaries in fcc Crystals Determined by X-ray Diffraction Profile Analysis, J. Applied Physics, 100, 023512 (2006), 2006
E. Schafler, K. Nyilas, S. Bernstorff, L. Zeipper, M. Zehetbauer, T. Ungàr: Microstructure of post deformed ECAP-Ti investigated by Multiple X-Ray Line Profile Analysis, Z.Kristallographie, 23 (2006) 129-134, 2006
H.Mughrabi, T. Ungár: Close up on crystal placsticity, Nature Materials, 5 (8): 601-602 (2006), 2006
J. Gubicza, N.Q. Chinh, Gy. Krállics, I. Schiller, T. Ungár: Microstructure of ultrafine-grained fcc metals produced by severe plastic deformation, Current Applied Physics, 6 (2006) 194-199, 2006
T. Ungár: Characterization of nanocrystalline materials by X-ray line profile analysis, J. Materials Science, (2006) DOI 10.1007/s10853-006-0696-1., 2006
T. Ungár, J. Gubicza: Nanocrystalline Materials Studied by Powder Diffraction Line Profile Analysis, Z. Kristallographie, 222 (2007) 114-128, 2007
K. Nyilas, T. Ungár, W. Skrotzki: Dislocation densities in soft and hard oriented grains of compressed NiAl polycrystals, Int. J. Mater. Sci. nyuomdaban, 2008
J. Gubicza, S. Nauyoks, L. Balogh, J. Labar, T. W. Zerda, T. Ungár: Influence of sintering temperature and pressure on crystallite size and lattice defect structure in nanocrystalline SiC, J. Mater. Res. 22 (2007) 1314-1321, 2008
Levente Balogh, T. Ungár, Yonghao Zhao, Y.T. Zhu, Zenji Horita, Cheng Xu, Terence G. Langdon: Influence of stacking-fault energy on microstructural characteristics of ultrafine-grain copper and copper-zinc alloys, Acta Materialia 56 (2008) 809–820, 2008
T. Ungár, M. G. Glavicic, L. Balogh, K. Nyilas, A. A. Salem, G. Ribárik, S. L. Semiatin: The Use of X-Ray Diffraction to Determine Slip and Twinning Activity in Commercial-Purity (CP) Titanium, Mater, Sci. Eng. A, (2008) in the press., 2008
L. Balogh, S. Nauyoks, T. W. Zerda, C. Pantea, S. Stelmakh, B. Palosz, T. Ungár: Structure of diamond-silicon carbide nanocomposites as a function of sintering temperature at 8 GPa, Mater. Sci. Eng. A, (2008) in the press, 2008
J. Gubicza, T. Ungár: Characterization of defect structures in nanocrystalline materials by X-ray line profile analysis, Z. Kristallographie, 222 (2007) 567-579., 2008



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