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Ezen az oldalon az NKFI Elektronikus Pályázatkezelő Rendszerében nyilvánosságra hozott projektjeit tekintheti meg.
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Dr. Mizsei, János: Thermal-electric Logic Circuit: A Solution for Nanoelectronics, 2nd International Conference on Signal Processing and Integrated Networks, 19-20 February, 2015, Amity School of Engineering and Technology, India, 2015 | J Mizsei, Marton C Bein, J Lappalainen, L Juhász, B Plesz: The phonsistor - a novel VO2 based nanoscale thermal-electronic device and its application in thermal-electronic logic circuits (TELC), In: 1st International Conference Functional Integrated nano Systems Conference Documentation . Graz, Ausztria, 2014.12.03-2014.12.05. Kiadvány: 2014. pp. 1, 2014 | János Mizsei, Márton C Bein, Jyrki Lappalainen, László Juhász: Scaling of Thermal-Electronic Logic Circuits, In: Chris Bailey, Marta Rencz, Bernhard Wunderle (szerk.) Proceedings of the 20th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC'14), 2014 | Mizsei János, Jyrkki Lappalainen: Logikai elrendezés, Lajstromszám: P 12 00249 Benyújtás helye: Magyarország, 2014 | J Mizsei, M C Bein, J Lappalainen, L Juhász: Thermal-electronic logic circuits: Scaling down, MICROELECTRON J 46: (12 A) 1175-1178, 2015 | J Mizsei, M C Bein, J Lappalainen, L Juhász, B Plesz: The Phonsistor – A Novel VO2 Based Nanoscale Thermal-electronic Device and Its Application in Thermal-electronic Logic Circuits (TELC), MATER TOD PROC 2: (8) 4272-4279, 2015 | Janos Mizsei, Laszlo Juhasz, Marton C Bein: Thermal nanoelectronics, EuroNanoForum 2015 conference (ENF 2015) 10-12 June 2015, Riga, Latvia (poszter, 1A-29, Best Poster Award) , 2015 | János Mizsei, Márton C Bein, Jyrki Lappalainen, László Juhász: Thermal-Electronic Circuits: Basics, Simulations, Experiments, In: Chris Bailey, Bernhard Wunderle, Sebastian Volz (szerk.) (szerk.) Proceedings of the 21st International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC'15) . Paris, Franciaország, 2015.09.30-2015.10.02. Kiadvány: Paris: 2015. Paper 2_4_id146. , 2015 | Mizsei J, Bein M C, Juhasz L, Jelinek E: Thermal-electronic devices and thermal-electronic logic circuits (TELC), In: J Nicholics (szerk.) (szerk.) 38th International Spring Seminar on Electronics Technology (ISSE). New York: IEEE, 2015. pp. 61-65., 2015 | Mizsei János, Jyrkki Lappalainen: Logikai elrendezés, Lajstromszám: P 12 00249 Benyújtás helye: Magyarország, 2014 | Mizsei J, Bein M C, Juhasz L, Jelinek E: Thermal-electronic devices and thermal-electronic logic circuits (TELC), In: J Nicholics (szerk.) (szerk.) 38th International Spring Seminar on Electronics Technology (ISSE). New York: IEEE, 2015. pp. 61-65., 2015 | János Mizsei, Jyrki Lappalainen, Laszló Pohl: Active thermal-electronic devices based on heat-sensitive metal-insulator-transition resistor elements, SENSOR ACTUAT A PHYS 267: 14-20, 2017 | László Pohl, Soma Ur, János Mizsei: Thermoelectrical modelling and simulation of devices based on VO2, MICROELECTRON RELIAB 79: 387-394, 2017 | J Mizsei, J Lappalainen: Thermal-electronic Integrated Circuits Using Thermally Sensitive VO2 MIT Material, PROCEDIA ENGINEERING 168: 1070-1073, 2016 | J Mizsei, J Lappalainen, S Ur, M Németh, L Gaál: Thermal - electronic device and integrated circuit, In: IEEE Proceedings of the 16th International Conference on Nanotechnology. New York: IEEE, 2016. pp. 966-969., 2016 | Soma Ur, János Mizsei, László Pohl: Modelling of the Thermoelectrical Performance of Devices Based on VO2, In: András Poppe (szerk.) Proc of the 22nd International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC'16). Budapest, 2016. pp. 307-310., 2016 | János Mizsei, Jyrki Lappalainen, Laszló Pohl: Active thermal-electronic devices based on heat-sensitive metal-insulator-transition resistor elements, SENSOR ACTUAT A PHYS 267: 14-20, 2017 | László Pohl, Soma Ur, János Mizsei: Thermoelectrical modelling and simulation of devices based on VO2, MICROELECTRON RELIAB 79: 387-394, 2017 | J Mizsei, M C Bein, J Lappalainen, L Juhász: Thermal-electronic logic circuits: Scaling down, MICROELECTRON J 46: (12 A) 1175-1178, 2015 |
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