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Érzékelő nanoszerkezetek fejlesztése és optikai monitorozása
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súgó
nyomtatás
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Ezen az oldalon az NKFI Elektronikus Pályázatkezelő Rendszerében nyilvánosságra hozott projektjeit tekintheti meg.
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Agocs Emil, Kozma Peter, Nador Judit, Hamori Andras, Janosov Milan, Kalas Benjamin, Kurunczi Sandor, Fodor Balint, Ehrentreich-Förster Eva, Fried Miklos, Horvath Robert, Petrik Peter: Grating coupled optical waveguide interferometry combined with in situ spectroscopic ellipsometry to monitor surface processes in aqueous solutions, APPLIED SURFACE SCIENCE in press: p. in press. 6 p., 2016 | Fodor B, Kozma P, Burger S, Fried M, Petrik P: Effective medium approximation of ellipsometric response from random surface roughness simulated by finite-element method, THIN SOLID FILMS in press: p. in press. 5 p., 2016 | Fodor Balint, Agocs Emil, Bardet Benjamin, Defforge Thomas, Cayrel Frederic, Alquier Daniel, Fried Miklos, Gautier Gael, Petrik Peter: Porosity and thickness characterization of porous Si and oxidized porous Si layers – an ultraviolet-visible-mid infrared ellipsometry study, MICROPOROUS AND MESOPOROUS MATERIALS 127: pp. 112-120., 2016 | Judit Nador, Benjamin Kalas, Andras Saftics, Emil Agocs, Peter Kozma, Laszlo Korosi, Inna Szekacs, Miklos Fried, Robert Horvath, Peter Petrik: Plasmon-enhanced two-channel in situ Kretschmann ellipsometry of protein adsorption, cellular adhesion and polyelectrolyte deposition on titania nanostructures, OPTICS EXPRESS 24:(5) pp. 4812-4823., 2016 | Agocs Emil, Kozma Peter, Nador Judit, Hamori Andras, Janosov Milan, Kalas Benjamin, Kurunczi Sandor, Fodor Balint, Ehrentreich-Förster Eva, Fried Miklos, Horvath Robert, Petrik Peter: Grating coupled optical waveguide interferometry combined with in situ spectroscopic ellipsometry to monitor surface processes in aqueous solutions, Applied Surface Science 421: pp. 289-294, 2017 | Fodor B, Kozma P, Burger S, Fried M, Petrik P: Effective medium approximation of ellipsometric response from random surface roughness simulated by finite-element method, Thin Solid Films 617: pp. 20-24, 2016 | Agocs E, Zolnai Z, Rossall AK, van den Berg JA, Fodor B, Lehninger D, Khomenkova L, Ponomaryov S, Gudymenko O, Yukhymchuk V, Kalas B, Heitmann J, Petrik P: Optical and structural characterization of Ge clusters embedded in ZrO2, Applied Surface Science 421: pp. 283-288., 2017 | Andras SAFTICS, Sándor KURUNCZI, Barbara TÜRK, Emil AGÓCS, Benjámin KALAS, Péter PETRIK, Miklós FRIED, Attila SULYOK, Szilvia BŐSZE, Robert HORVATH: SPIN COATED CARBOXYMETHY L DEXTRAN LAYERS ON TiO2-SiO2 OPTICAL WAVEGUIDE SURFACES, REVUE ROUMAINE DE CHIMIE 62:(10) pp. 775-782., 2017 | Fodor B, Defforge T, Agócs E, Fried M, Gautier G, Petrik P: Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires, Applied Surface Science 421: pp. 397-404, 2017 | Kalas B, Nador J, Agocs E, Saftics A, Kurunczi S, Fried M, Petrik P: Protein adsorption monitored by plasmon-enhanced semi-cylindrical Kretschmann ellipsometry, Applied Surface Science 421: pp. 585-592, 2017 | Lohner T, Serényi M, Szilágyi E, Zolnai Z, Czigány Z, Khánh NQ, Petrik P, Fried M: Spectroellipsometric detection of silicon substrate damage caused by radiofrequency sputtering of niobium oxide, Applied Surface Science 421: pp. 636-642, 2017 | Petrik P, Sulyok A, Novotny T, Perez-Feró E, Kalas B, Agocs E, Lohner T, Lehninger D, Khomenkova L, Nagy R, Heitmann J, Menyhard M, Hózer Z: Optical properties of Zr and ZrO2, Applied Surface Science 421: pp. 744-747, 2017 | Andras SAFTICS, Sándor KURUNCZI, Barbara TÜRK, Emil AGÓCS, Benjámin KALAS, Péter PETRIK, Miklós FRIED, Attila SULYOK, Szilvia BŐSZE, Robert HORVATH: SPIN COATED CARBOXYMETHY L DEXTRAN LAYERS ON TiO2-SiO2 OPTICAL WAVEGUIDE SURFACES, REVUE ROUMAINE DE CHIMIE 62:(10) pp. 775-782., 2017 | Petrik P, Agocs E, Kalas B, Fodor B, Lohner T, Nador J, Saftics A, Kurunczi S, Novotny T, Perez-Feró E, Nagy R, Hamori A, Horvath R, Hózer Z, Fried M: Nanophotonics of biomaterials and inorganic nanostructures, Journal of Physics-Conference Series, 794:(1) Paper 012004. 10 p. (2017), 2017 | Kalas Benjamin, Pollakowski Beatrix, Nutsch Andreas, Streeck Cornelia, Nador Judit, Fried Miklós, Beckhoff Burkhard, Petrik Péter: Ellipsometric and X-Ray Spectrometric Investigation of Fibrinogen Protein Layers, physica status solidi c-current topics in solid state physics 14:(12) Paper 1700210. (2017), 2017 | Fogarassy Z, Petrik P, Duta L, Mihailescu IN, Anastasescu M, Gartner M, Antonova K, Szekeres A: TEM and AFM studies of aluminium nitride films synthesized by pulsed laser deposition, Applied Physics A - materials science and processing 123:(12) Paper 756. 12 p. (2017), 2017 | Lohner Tivadar, Kalas Benjamin, Petrik Peter, Zolnai Zsolt, Serényi Miklós, Sáfrán György: Refractive Index Variation of Magnetron-Sputtered a-Si1−xGex by “One-Sample Concept” Combinatory, Applied Sciences-Basel 8:(5) Paper 826. (2018), 2018 | Hristova-Vasileva T, Petrik P, Nesheva D, Fogarassy Z, Lábár J, Kaschieva S, Dmitriev SN, Antonova K: Influence of 20 MeV electron irradiation on the optical properties and phase composition of SiOx thin films, Journal of Applied Physics 123:(19) Paper 195303. 8 p. (2018), 2018 | Gurbán S, Petrik P, Serényi M, Sulyok A, Menyhárd M, Baradács E, Parditka B, Cserháti C, Langer GA, Erdélyi Z: Electron irradiation induced amorphous SiO 2 formation at metal oxide/Si interface at room temperature; electron beam writing on interfaces, Scientific Reports 8:(1) p. 2124. 7 p. (2018), 2018 | Bányász I, Pelli S, Nunzi-Conti G, Righini GC, Berneschi S, Szilágyi E, Németh A, Fried M, Petrik P, Agócs E, Kalas B, Zolnai Z, Khanh NQ, Rajta I, Nagy GUL, Havranek V, Vosecek V, Veres M, Himics L: Design, Ion beam fabrication and test of integrated optical elements, Proceedings of the 6th International Conference on Photonics, Optics and Laser Technology. 340 p., 2018 | Peter Petrik: Solar Cells with Photonic and Plasmonic Structures, Springer, 2018 | P. Petrik, A. Romanenko, B. Kalas, L. Péter, T. Novotny, E. Perez-Feró, B. Fodor, E. Agocs, T. Lohner, S. Kurunczi, M. Stoica, M. Gartner, Z. Hózer: Optical Properties of Oxidized, Hydrogenated, and Native Zirconium Surfaces for Wavelengths from 0.3 to 25 um - A Study by Ex Situ and In Situ Spectroscopic Ellipsometry, Phys. Status Solidi. 216 (2019) 1800676, 2019 | D. Nesheva, P. Petrik, T. Hristova-Vasileva, Z. Fogarassy, B. Kalas, M. Šćepanović, S. Kaschieva, S.N. Dmitriev, K. Antonova: Changes in composite nc-Si-SiO2 thin films caused by 20 MeV electron irradiation, Nucl. Instruments Methods Phys. Res. Sect. B Beam Interact. with Mater. Atoms. 458 (2019) 159–163, 2019 | L. Kolaklieva, V. Chitanov, A. Szekeres, K. Antonova, P. Terziyska, Z. Fogarassy, P. Petrik, I. Mihailescu, L. Duta: Pulsed Laser Deposition of Aluminum Nitride Films: Correlation between Mechanical, Optical, and Structural Properties, Coatings. 9 (2019) 195, 2019 | B. Kalas, E. Agocs, A. Romanenko, P. Petrik: In Situ Characterization of Biomaterials at Solid-Liquid Interfaces Using Ellipsometry in the UV-Visible-NIR Wavelength Range, Status Solidi Appl. Mater. Sci. 216 (2019) 1800762, 2019 |
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